Structural studies of advanced functional materials by synchrotron-based x-ray absorption spectroscopy: BL5.2 at SLRI, Thailand*

Pinit Kidkhunthod

  • ANSN Editor
Keywords: nano


This paper highlights the use of the x-ray absorption spectroscopy (XAS) as a local structural tool unlike x-ray diffraction for selected atoms in advanced functional materials including energy storage materials, dielectric materials and thermoelectric materials. The information concerning the oxidation states and local atomic structure around probing atoms will be revealed using x-ray absorption near edge structure (XANES) and extended x-ray absorption fine structure (EXAFS). The XAS beamline: BL5.2 at the Synchrotron Light Research Institute (SLRI) (public organization), Thailand, and its characteristic including available of measured energy ranges, examples of measured spectra of Mg, S and Ti K-edge XAS are also presented. In addition, in situ XAS set up and experiment carried out at this beamline are also outlined

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